The Scanning Electron Microscope
The scanning electron microscope (SEM) provides information regarding surface
structure, whether that surface is of a preserved, chemically fixed cell, or the surface
of a microchip, crystal, rock or other non-living object.
There are two SEMs at MAGIC. One is a Philips XL-40 (shown
right). An IXRF x-ray energy dispersive spectrometer is attached to the SEM to analyze
elemental composition within samples.